Our PGA Test Socket is designed for reliable and repeatable IC testing of Pin Grid Array (PGA), Ceramic PGA (CPGA), and Ball Grid Array (BGA) packages. Engineered for durability and high signal integrity, this socket ensures accurate validation, burn-in, and functional testing of high-pin-count integrated circuits.

• Zero Insertion Force (ZIF) & Low-Insertion-Force (LIF) Options - Protects delicate IC pins while facilitating rapid device loading/unloading.
• High-Cycle Life (50,000+ insertions) - Robust construction for long-term reliability in production & lab environments.
• Custom Pin Configurations - Supports multiple PGA pitches (2.54mm, 1.27mm, etc.) and BGA variants.
• Multi-Test Compatibility - Works with functional, environmental (high-temp), and burn-in testing.
• Low Contact Resistance ( <10mΩ) - Ensures minimal signal loss for precise measurements.

ZIF PGA Socket vs LIF PGA Socket

In addition to standard PGA test sockets, we offer specialized solutions including:

BGA to PGA Male and Female Socket

BGA to PGA Test Socket (Female)

PGA Socket (Male)

Our PGA test sockets are engineered for precision, reliability, and performance, delivering unmatched value for your IC testing needs. Here's why engineers and manufacturers trust our solutions:

Whether for prototyping, burn-in testing, or mass production, our PGA sockets ensure reliable, repeatable results --helping you reduce downtime and maximize efficiency.